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半導體中心-英文

Plasma-Enhanced Chemical Vapor Deposition System

🏭 Brand / Model
Oxford / PlasmaPro 100

 

Equipment Function / Features
This system adopts an Inductively Coupled Plasma (ICP) source design, enabling high-uniformity and high-quality thin film deposition under low-temperature conditions. It is particularly suitable for temperature-sensitive substrates or materials and meets the demanding process requirements of semiconductor device fabrication, advanced optical structures, and nanomaterial applications.

 

📊 Technical Specifications

  • ICP plasma source power: up to 3000 W (2 MHz)
  • Bottom electrode RF power: up to 300 W (13.56 MHz)
  • Process gases: CF4、O2、Ar、N2O、NH3、SiH4、N2
  • Process temperature: RT ~ 400 °C
  • Maximum substrate size: Samples up to 8-inch diameter
  • Key feature: Capable of high-quality thin film deposition at low working temperatures (<200 °C), ideal for temperature-sensitive substrates and materials.

 

🔬 Applications

  • Research and development of low-temperature, high-quality thin film deposition
  • Suitable for temperature-sensitive substrates (e.g., polymers, metal layers, photoresist-coated samples)
  • Processes requiring dense, low-stress, and highly uniform thin films
  • Fabrication of NEMS/MEMS and optoelectronic devices
  • Supports multi-material process development (oxides, nitrides, carbides, etc.)

 

📍 Location
CVD Area, Cleanroom (2F), Excellence Research Building, Shuiyuan Campus, National Taiwan University

 

📞 Administrator / Reservation Method
Administrator: Dr. Chia-Yang Tsai
Reservation: Please make a reservation through the “Chip Driven – Taiwan Semiconductor Resource Sharing Platform.”

 

Safety and Operation Guidelines

  • Users must complete equipment training and obtain operation authorization before use
  • Follow all cleanroom safety regulations and standard operating procedures (SOP)
  • Stop operation immediately and notify the administrator if any abnormal conditions occur
  • Photoresists and adhesive tapes are strictly prohibited inside the chamber
  • Refer to the Operation Manual for detailed procedures