訊息公告
2023-09-13
112年9月18日(一)，崛智科技有限公司 陳世豪執行長
Empowering Innovation with Generated Model for Virtual Silicon and DTCO
Shi-Hao Chen (Hock) is currently the CEO of DigWise Technology, a solution provider for best energy efficiency, and the CEO of DipSci Technology, a solution provider that provides on-chip process monitoring and machine learning technologies to improve productivity.
He received the Ph.D. degree from the Department of Computer Science, National Tsing Hua University, Hsinchu 30043, Taiwan in 2012.
His current research interests include machine-learning techniques for EDA, low-power and process-design co-optimization methodologies.
He received the Ph.D. degree from the Department of Computer Science, National Tsing Hua University, Hsinchu 30043, Taiwan in 2012.
His current research interests include machine-learning techniques for EDA, low-power and process-design co-optimization methodologies.
Abstract:
探索使用生成對抗網絡（GAN）在晶片製造過程中生成晶圓級的WAT和CP測試數據，並關注設計技術協同優化（DTCO）。生成的虛擬矽片數據涵蓋了重要的性能特徵、物理電性質、晶圓級製程參數分佈，以及有關晶圓級均勻性和缺陷的隱含信息。此創新方法克服了數據獲取障礙，高效壓縮大型數據集的同時確保數據的機密性，並對先進的電子設計自動化（EDA）工具的發展具有巨大潛力，加速實現製程和晶片設計流程的協同優化。
Exploring the use of Generative Adversarial Networks (GANs) to generate wafer-level Wafer Acceptance Test (WAT) and Chip Probe (CP) test data in chip manufacturing processes, with a focus on Design-Technology Co-Optimization (DTCO). The generated virtual silicon data encompasses essential performance characteristics, physical electrical properties, wafer-level process parameter distributions, as well as implicit information about wafer-level uniformity and defects. This innovative approach overcomes data acquisition barriers, efficiently compresses large datasets while ensuring data confidentiality, and holds immense potential for the development of advanced Electronic Design Automation (EDA) tools, expediting the realization of collaborative optimization in manufacturing processes and chip design flows.