Title: Silent Data Corruption/Error - The New Face of an Old Problem

Abstract:

Silent data corruption/error (SDC/SDE) has existed since the beginning of computing. It is a rare occurrence that recently surfaced as a serious problem at cloud computing hyper-scalers. It is a silent killer that can result in transaction data loss and worse, compromised safety in the case of automotive systems. This talk will survey the topic of SDC including recent examples, possible root causes, facets from system to devices, related research activities and future opportunities.

Speaker Bio:

Harry Chen has been with MediaTek since 2008 currently holding the position of IC Testing Scientist investigating advanced design and test methodologies through collaborative research with Taiwan universities. He actively participates in numerous conferences serving on technical program committees, publishing papers, and giving talks. Outside of MediaTek, he is Co-Chair of VLSI-DAT Design Automation and Test Methodology Subcommittee, Co-Chair of SEMI Taiwan Testing Committee, and leads IEEE Heterogeneous Integration Roadmap (HIR) Test Technology Working Group (TWG) System-Level Test (SLT) Section. Prior to MediaTek, Harry was a staff engineer at Analog Devices (ADI) in the USA working on mobile phone system-on-chip integration and implementation (8 years). Prior to ADI, Harry spent ~14 years in electronic design automation (EDA) developing IC test-automation tools at Cadence Design Systems and two EDA start-ups (Gateway DA and Ambit DS) that were acquired by Cadence. Harry has dual BS degrees in Applied Biology and Electrical Engineering (EE) from MIT, and MSEE and PhD candidacy from Stanford University.